JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino **Mint**
USD 21.49 USD
JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino & Richard Y. Wang & James D. Funk **Mint Condition**.
Specifications
| ISBN-10 | 0262513358 |
| Genre | COMPUTERS |
| ISBN | 9780262513357 |
| Publication Name | Journey to Data Quality |
| Publisher | MIT Press |
| Item Length | 8.9 in |
| Publication Year | 2009 |
| Type | Textbook |
| Format | Trade Paperback |
| Language | English |
| Item Height | 0.5 in |
| Item Weight | 11 Oz |
| Item Width | 6.3 in |
| Number Of Pages | 240 Pages |
You will find that this textbook is written in a conversational, easy-to-follow tone.
